A unified confidence interval for reliability-related quantities of two-parameter Weibull distribution

10.1080/00949650701227452

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Bibliographic Details
Main Authors: Yang, Z., Xie, M., Wong, A.C.M.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62984
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Institution: National University of Singapore