A unified confidence interval for reliability-related quantities of two-parameter Weibull distribution
10.1080/00949650701227452
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Main Authors: | Yang, Z., Xie, M., Wong, A.C.M. |
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Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62984 |
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Institution: | National University of Singapore |
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