Accelerated life test plans for repairable systems with multiple independent risks

Accelerated life test plans for repairable systems with multiple independent risks

10.1109/TR.2010.2040758

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Bibliographic Details
Main Authors: Liu, X., Tang, L.-C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Accelerated life test
Bayesian optimal design
Competing risks
D-optimality
Kullback-Leibler distance
Power law process
Repairable systems
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62989
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/62989

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