Accelerated life test plans for repairable systems with multiple independent risks
10.1109/TR.2010.2040758
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sg-nus-scholar.10635-629892023-10-27T08:18:22Z Accelerated life test plans for repairable systems with multiple independent risks Liu, X. Tang, L.-C. INDUSTRIAL & SYSTEMS ENGINEERING Accelerated life test Bayesian optimal design Competing risks D-optimality Kullback-Leibler distance Power law process Repairable systems 10.1109/TR.2010.2040758 IEEE Transactions on Reliability 59 1 115-127 IEERA 2014-06-17T06:58:54Z 2014-06-17T06:58:54Z 2010 Article Liu, X., Tang, L.-C. (2010). Accelerated life test plans for repairable systems with multiple independent risks. IEEE Transactions on Reliability 59 (1) : 115-127. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2010.2040758 00189529 http://scholarbank.nus.edu.sg/handle/10635/62989 000278618100012 Scopus |
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Accelerated life test Bayesian optimal design Competing risks D-optimality Kullback-Leibler distance Power law process Repairable systems |
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Accelerated life test Bayesian optimal design Competing risks D-optimality Kullback-Leibler distance Power law process Repairable systems Liu, X. Tang, L.-C. Accelerated life test plans for repairable systems with multiple independent risks |
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10.1109/TR.2010.2040758 |
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INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Liu, X. Tang, L.-C. |
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Article |
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Liu, X. Tang, L.-C. |
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Liu, X. |
title |
Accelerated life test plans for repairable systems with multiple independent risks |
title_short |
Accelerated life test plans for repairable systems with multiple independent risks |
title_full |
Accelerated life test plans for repairable systems with multiple independent risks |
title_fullStr |
Accelerated life test plans for repairable systems with multiple independent risks |
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Accelerated life test plans for repairable systems with multiple independent risks |
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accelerated life test plans for repairable systems with multiple independent risks |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/62989 |
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1781782174892032000 |