Degradation-based burn-in planning under competing risks

10.1080/00401706.2012.676946

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Bibliographic Details
Main Authors:	Ye, Z.-S., Xie, M., Shen, Y., Tang, L.-C.
Other Authors:	INDUSTRIAL & SYSTEMS ENGINEERING
Format:	Article
Published:	2014
Subjects:	Catastrophic failure Degradation-threshold failure Gamma process Multiple modes of failure
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/63087
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Institution:	National University of Singapore

Description
Summary:	10.1080/00401706.2012.676946

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