Degradation-based burn-in planning under competing risks

Degradation-based burn-in planning under competing risks

10.1080/00401706.2012.676946

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Bibliographic Details
Main Authors: Ye, Z.-S., Xie, M., Shen, Y., Tang, L.-C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Catastrophic failure
Degradation-threshold failure
Gamma process
Multiple modes of failure
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63087
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/63087

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