Modeling and analysis of correlated software failures of multiple types

IEEE Transactions on Reliability

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Bibliographic Details
Main Authors: Dai, Y.-S., Xie, M., Poh, K.-L.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63184
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Institution: National University of Singapore

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