Shewhart-like charting technique for high yield processes

Quality and Reliability Engineering International

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Bibliographic Details
Main Authors: Xie, W., Xie, M., Goh, T.N.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63310
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Institution: National University of Singapore
Description
Summary:Quality and Reliability Engineering International