Shewhart-like charting technique for high yield processes

Quality and Reliability Engineering International

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Main Authors: Xie, W., Xie, M., Goh, T.N.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63310
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-633102015-02-02T09:29:38Z Shewhart-like charting technique for high yield processes Xie, W. Xie, M. Goh, T.N. INDUSTRIAL & SYSTEMS ENGINEERING Quality and Reliability Engineering International 11 3 189-196 QREIE 2014-06-17T07:02:35Z 2014-06-17T07:02:35Z 1995-05 Article Xie, W.,Xie, M.,Goh, T.N. (1995-05). Shewhart-like charting technique for high yield processes. Quality and Reliability Engineering International 11 (3) : 189-196. ScholarBank@NUS Repository. 07488017 http://scholarbank.nus.edu.sg/handle/10635/63310 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Quality and Reliability Engineering International
author2 INDUSTRIAL & SYSTEMS ENGINEERING
author_facet INDUSTRIAL & SYSTEMS ENGINEERING
Xie, W.
Xie, M.
Goh, T.N.
format Article
author Xie, W.
Xie, M.
Goh, T.N.
spellingShingle Xie, W.
Xie, M.
Goh, T.N.
Shewhart-like charting technique for high yield processes
author_sort Xie, W.
title Shewhart-like charting technique for high yield processes
title_short Shewhart-like charting technique for high yield processes
title_full Shewhart-like charting technique for high yield processes
title_fullStr Shewhart-like charting technique for high yield processes
title_full_unstemmed Shewhart-like charting technique for high yield processes
title_sort shewhart-like charting technique for high yield processes
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/63310
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