Shewhart-like charting technique for high yield processes
Quality and Reliability Engineering International
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sg-nus-scholar.10635-633102015-02-02T09:29:38Z Shewhart-like charting technique for high yield processes Xie, W. Xie, M. Goh, T.N. INDUSTRIAL & SYSTEMS ENGINEERING Quality and Reliability Engineering International 11 3 189-196 QREIE 2014-06-17T07:02:35Z 2014-06-17T07:02:35Z 1995-05 Article Xie, W.,Xie, M.,Goh, T.N. (1995-05). Shewhart-like charting technique for high yield processes. Quality and Reliability Engineering International 11 (3) : 189-196. ScholarBank@NUS Repository. 07488017 http://scholarbank.nus.edu.sg/handle/10635/63310 NOT_IN_WOS Scopus |
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Quality and Reliability Engineering International |
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INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Xie, W. Xie, M. Goh, T.N. |
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Xie, W. Xie, M. Goh, T.N. |
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Xie, W. Xie, M. Goh, T.N. Shewhart-like charting technique for high yield processes |
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Xie, W. |
title |
Shewhart-like charting technique for high yield processes |
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Shewhart-like charting technique for high yield processes |
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Shewhart-like charting technique for high yield processes |
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Shewhart-like charting technique for high yield processes |
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Shewhart-like charting technique for high yield processes |
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shewhart-like charting technique for high yield processes |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/63310 |
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