Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films

Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films

10.1103/PhysRevB.82.064108

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Bibliographic Details
Main Authors: Liu, H., Yao, K., Yang, P., Du, Y., He, Q., Gu, Y., Li, X., Wang, S., Zhou, X., Wang, J.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/65047
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Institution: National University of Singapore

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