Structured fault-detection and diagnosis using finite-state automaton
IECON Proceedings (Industrial Electronics Conference)
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2014
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sg-nus-scholar.10635-684282015-01-16T19:21:52Z Structured fault-detection and diagnosis using finite-state automaton Ramkumar, K.B. Philips, Patrick Presig, Heinz A. Ho, W.K. Lim, K.W. ELECTRICAL ENGINEERING IECON Proceedings (Industrial Electronics Conference) 3 1667-1672 IEPRE 2014-06-18T06:13:14Z 2014-06-18T06:13:14Z 1998 Review Ramkumar, K.B.,Philips, Patrick,Presig, Heinz A.,Ho, W.K.,Lim, K.W. (1998). Structured fault-detection and diagnosis using finite-state automaton. IECON Proceedings (Industrial Electronics Conference) 3 : 1667-1672. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/68428 NOT_IN_WOS Scopus |
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IECON Proceedings (Industrial Electronics Conference) |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Ramkumar, K.B. Philips, Patrick Presig, Heinz A. Ho, W.K. Lim, K.W. |
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Review |
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Ramkumar, K.B. Philips, Patrick Presig, Heinz A. Ho, W.K. Lim, K.W. |
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Ramkumar, K.B. Philips, Patrick Presig, Heinz A. Ho, W.K. Lim, K.W. Structured fault-detection and diagnosis using finite-state automaton |
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Ramkumar, K.B. |
title |
Structured fault-detection and diagnosis using finite-state automaton |
title_short |
Structured fault-detection and diagnosis using finite-state automaton |
title_full |
Structured fault-detection and diagnosis using finite-state automaton |
title_fullStr |
Structured fault-detection and diagnosis using finite-state automaton |
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Structured fault-detection and diagnosis using finite-state automaton |
title_sort |
structured fault-detection and diagnosis using finite-state automaton |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/68428 |
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