Structured fault-detection and diagnosis using finite-state automaton

IECON Proceedings (Industrial Electronics Conference)

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Bibliographic Details
Main Authors:	Ramkumar, K.B., Philips, Patrick, Presig, Heinz A., Ho, W.K., Lim, K.W.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Review
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/68428
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Institution:	National University of Singapore

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