A systematic on-wafer characterization technique for surface-mounted microwave and RF packages

Advances in Electronic Packaging

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Bibliographic Details
Main Authors:	Ooi, B.L., Qiu, Y.L., Leong, M.S., Soe, M.M.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Multi-line Calibration Reciprocity Condition
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69101
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69101
record_format	dspace
spelling	sg-nus-scholar.10635-691012015-03-26T18:58:49Z A systematic on-wafer characterization technique for surface-mounted microwave and RF packages Ooi, B.L. Qiu, Y.L. Leong, M.S. Soe, M.M. ELECTRICAL & COMPUTER ENGINEERING Multi-line Calibration Reciprocity Condition Advances in Electronic Packaging 1 45-48 2014-06-19T02:56:50Z 2014-06-19T02:56:50Z 2001 Conference Paper Ooi, B.L.,Qiu, Y.L.,Leong, M.S.,Soe, M.M. (2001). A systematic on-wafer characterization technique for surface-mounted microwave and RF packages. Advances in Electronic Packaging 1 : 45-48. ScholarBank@NUS Repository. 0791835405 http://scholarbank.nus.edu.sg/handle/10635/69101 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Multi-line Calibration Reciprocity Condition
spellingShingle	Multi-line Calibration Reciprocity Condition Ooi, B.L. Qiu, Y.L. Leong, M.S. Soe, M.M. A systematic on-wafer characterization technique for surface-mounted microwave and RF packages
description	Advances in Electronic Packaging
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ooi, B.L. Qiu, Y.L. Leong, M.S. Soe, M.M.
format	Conference or Workshop Item
author	Ooi, B.L. Qiu, Y.L. Leong, M.S. Soe, M.M.
author_sort	Ooi, B.L.
title	A systematic on-wafer characterization technique for surface-mounted microwave and RF packages
title_short	A systematic on-wafer characterization technique for surface-mounted microwave and RF packages
title_full	A systematic on-wafer characterization technique for surface-mounted microwave and RF packages
title_fullStr	A systematic on-wafer characterization technique for surface-mounted microwave and RF packages
title_full_unstemmed	A systematic on-wafer characterization technique for surface-mounted microwave and RF packages
title_sort	systematic on-wafer characterization technique for surface-mounted microwave and rf packages
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69101
_version_	1681086952037679104

A systematic on-wafer characterization technique for surface-mounted microwave and RF packages

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