Analytical extraction of extrinsic and intrinsic FET parameters

IEEE Transactions on Microwave Theory and Techniques

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Bibliographic Details
Main Authors: Ooi, B.L., Zhong, Z., Leong, M.-S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69413
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Institution: National University of Singapore