Applications of scanning Near-field photon emission microscopy

10.1361/cp2008istfa025

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Bibliographic Details
Main Authors:	Isakov, D., Tan, B., Phang, J., Yeo, Y., Tio, A., Zhang, Y., Geinzer, T., Balk, L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69438
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69438
record_format	dspace
spelling	sg-nus-scholar.10635-694382023-10-26T08:47:15Z Applications of scanning Near-field photon emission microscopy Isakov, D. Tan, B. Phang, J. Yeo, Y. Tio, A. Zhang, Y. Geinzer, T. Balk, L. ELECTRICAL & COMPUTER ENGINEERING 10.1361/cp2008istfa025 Conference Proceedings from the International Symposium for Testing and Failure Analysis 25-29 2014-06-19T03:00:42Z 2014-06-19T03:00:42Z 2008 Conference Paper Isakov, D., Tan, B., Phang, J., Yeo, Y., Tio, A., Zhang, Y., Geinzer, T., Balk, L. (2008). Applications of scanning Near-field photon emission microscopy. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 25-29. ScholarBank@NUS Repository. https://doi.org/10.1361/cp2008istfa025 9780871707147 http://scholarbank.nus.edu.sg/handle/10635/69438 000288182500005 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1361/cp2008istfa025
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Isakov, D. Tan, B. Phang, J. Yeo, Y. Tio, A. Zhang, Y. Geinzer, T. Balk, L.
format	Conference or Workshop Item
author	Isakov, D. Tan, B. Phang, J. Yeo, Y. Tio, A. Zhang, Y. Geinzer, T. Balk, L.
spellingShingle	Isakov, D. Tan, B. Phang, J. Yeo, Y. Tio, A. Zhang, Y. Geinzer, T. Balk, L. Applications of scanning Near-field photon emission microscopy
author_sort	Isakov, D.
title	Applications of scanning Near-field photon emission microscopy
title_short	Applications of scanning Near-field photon emission microscopy
title_full	Applications of scanning Near-field photon emission microscopy
title_fullStr	Applications of scanning Near-field photon emission microscopy
title_full_unstemmed	Applications of scanning Near-field photon emission microscopy
title_sort	applications of scanning near-field photon emission microscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69438
_version_	1781783095981113344

Applications of scanning Near-field photon emission microscopy

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