Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-695102015-01-25T11:30:34Z Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides Loh, W.Y. Cho, B.J. Li, M.F. ELECTRICAL & COMPUTER ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 59-62 2014-06-19T03:01:31Z 2014-06-19T03:01:31Z 2001 Conference Paper Loh, W.Y.,Cho, B.J.,Li, M.F. (2001). Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 59-62. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/69510 NOT_IN_WOS Scopus |
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National University of Singapore |
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Singapore |
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| description |
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Loh, W.Y. Cho, B.J. Li, M.F. |
| format |
Conference or Workshop Item |
| author |
Loh, W.Y. Cho, B.J. Li, M.F. |
| spellingShingle |
Loh, W.Y. Cho, B.J. Li, M.F. Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides |
| author_sort |
Loh, W.Y. |
| title |
Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides |
| title_short |
Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides |
| title_full |
Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides |
| title_fullStr |
Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides |
| title_full_unstemmed |
Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides |
| title_sort |
bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/69510 |
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1681087026919636992 |