Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy

10.1116/1.1865114

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Bibliographic Details
Main Authors: Yiang, K.Y., Yoo, W.J., Krishnamoorthy, A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70073
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-700732023-10-30T08:41:37Z Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy Yiang, K.Y. Yoo, W.J. Krishnamoorthy, A. ELECTRICAL & COMPUTER ENGINEERING 10.1116/1.1865114 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 23 2 433-436 JVTBD 2014-06-19T03:07:55Z 2014-06-19T03:07:55Z 2005 Conference Paper Yiang, K.Y., Yoo, W.J., Krishnamoorthy, A. (2005). Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 23 (2) : 433-436. ScholarBank@NUS Repository. https://doi.org/10.1116/1.1865114 10711023 http://scholarbank.nus.edu.sg/handle/10635/70073 000228788600015 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1116/1.1865114
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Yiang, K.Y.
Yoo, W.J.
Krishnamoorthy, A.
format Conference or Workshop Item
author Yiang, K.Y.
Yoo, W.J.
Krishnamoorthy, A.
spellingShingle Yiang, K.Y.
Yoo, W.J.
Krishnamoorthy, A.
Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy
author_sort Yiang, K.Y.
title Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy
title_short Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy
title_full Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy
title_fullStr Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy
title_full_unstemmed Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy
title_sort effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ fourier transform infrared spectroscopy
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/70073
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