Effects of electric field in band alignment measurements using photoelectron spectroscopy

10.1002/sia.3851

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Bibliographic Details
Main Authors:	Chiam, S.Y., Liu, Z.Q., Pan, J.S., Manippady, K.K., Wong, L.M., Chim, W.K.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	band offsets extra-atomic relaxation field effects UPS work function XPS
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/70096
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Institution:	National University of Singapore

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