Enhanced pixel by pixel emissivity correction for thermal microscopy
Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004
Saved in:
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Conference or Workshop Item |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70183 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-70183 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-701832024-11-13T12:54:06Z Enhanced pixel by pixel emissivity correction for thermal microscopy Goh, S.H. Yim, K.H. Phang, J.C.H. Balk, L.J. ELECTRICAL & COMPUTER ENGINEERING Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004 451-456 2014-06-19T03:09:12Z 2014-06-19T03:09:12Z 2004 Conference Paper Goh, S.H.,Yim, K.H.,Phang, J.C.H.,Balk, L.J. (2004). Enhanced pixel by pixel emissivity correction for thermal microscopy. Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004 : 451-456. ScholarBank@NUS Repository. 0871708078 http://scholarbank.nus.edu.sg/handle/10635/70183 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Goh, S.H. Yim, K.H. Phang, J.C.H. Balk, L.J. |
| format |
Conference or Workshop Item |
| author |
Goh, S.H. Yim, K.H. Phang, J.C.H. Balk, L.J. |
| spellingShingle |
Goh, S.H. Yim, K.H. Phang, J.C.H. Balk, L.J. Enhanced pixel by pixel emissivity correction for thermal microscopy |
| author_sort |
Goh, S.H. |
| title |
Enhanced pixel by pixel emissivity correction for thermal microscopy |
| title_short |
Enhanced pixel by pixel emissivity correction for thermal microscopy |
| title_full |
Enhanced pixel by pixel emissivity correction for thermal microscopy |
| title_fullStr |
Enhanced pixel by pixel emissivity correction for thermal microscopy |
| title_full_unstemmed |
Enhanced pixel by pixel emissivity correction for thermal microscopy |
| title_sort |
enhanced pixel by pixel emissivity correction for thermal microscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/70183 |
| _version_ |
1821215227335671808 |