Enhanced pixel by pixel emissivity correction for thermal microscopy
Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004
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| Main Authors: | , , , |
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| 格式: | Conference or Workshop Item |
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2014
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| 在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/70183 |
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| 機構: | National University of Singapore |