Instantaneous symbol error outage probability over fading channels with imperfect channel state information

10.1109/VETECS.2010.5493772

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Bibliographic Details
Main Authors: Wu, M., Kam, P.Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70613
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Institution: National University of Singapore
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