Temperature control and in-situ fault detection of wafer warpage

IECON Proceedings (Industrial Electronics Conference)

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Bibliographic Details
Main Authors: Ho, W.K., Yap, C., Tay, A., Chen, W., Lim, K.W.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71950
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-719502024-11-14T02:32:31Z Temperature control and in-situ fault detection of wafer warpage Ho, W.K. Yap, C. Tay, A. Chen, W. Lim, K.W. ELECTRICAL & COMPUTER ENGINEERING MECHANICAL ENGINEERING IECON Proceedings (Industrial Electronics Conference) 3 2560-2565 IEPRE 2014-06-19T03:29:41Z 2014-06-19T03:29:41Z 2004 Conference Paper Ho, W.K.,Yap, C.,Tay, A.,Chen, W.,Lim, K.W. (2004). Temperature control and in-situ fault detection of wafer warpage. IECON Proceedings (Industrial Electronics Conference) 3 : 2560-2565. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/71950 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description IECON Proceedings (Industrial Electronics Conference)
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Ho, W.K.
Yap, C.
Tay, A.
Chen, W.
Lim, K.W.
format Conference or Workshop Item
author Ho, W.K.
Yap, C.
Tay, A.
Chen, W.
Lim, K.W.
spellingShingle Ho, W.K.
Yap, C.
Tay, A.
Chen, W.
Lim, K.W.
Temperature control and in-situ fault detection of wafer warpage
author_sort Ho, W.K.
title Temperature control and in-situ fault detection of wafer warpage
title_short Temperature control and in-situ fault detection of wafer warpage
title_full Temperature control and in-situ fault detection of wafer warpage
title_fullStr Temperature control and in-situ fault detection of wafer warpage
title_full_unstemmed Temperature control and in-situ fault detection of wafer warpage
title_sort temperature control and in-situ fault detection of wafer warpage
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/71950
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