On measurement systems in the IC assembly industry

IEEE International Engineering Management Conference

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Bibliographic Details
Main Authors: Lai, Y.W., Duan, C.M., Chew, E.P.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72358
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Institution: National University of Singapore