On measurement systems in the IC assembly industry
IEEE International Engineering Management Conference
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Main Authors: | Lai, Y.W., Duan, C.M., Chew, E.P. |
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Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72358 |
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Institution: | National University of Singapore |
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