Charging identification and compensation in the scanning electron microscope

Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA

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Bibliographic Details
Main Authors: Wong, W.K., Thong, J.T.L., Phang, J.C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72520
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-725202024-11-13T21:15:41Z Charging identification and compensation in the scanning electron microscope Wong, W.K. Thong, J.T.L. Phang, J.C.H. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 97-102 00234 2014-06-19T05:08:58Z 2014-06-19T05:08:58Z 1997 Conference Paper Wong, W.K.,Thong, J.T.L.,Phang, J.C.H. (1997). Charging identification and compensation in the scanning electron microscope. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 97-102. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72520 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Wong, W.K.
Thong, J.T.L.
Phang, J.C.H.
format Conference or Workshop Item
author Wong, W.K.
Thong, J.T.L.
Phang, J.C.H.
spellingShingle Wong, W.K.
Thong, J.T.L.
Phang, J.C.H.
Charging identification and compensation in the scanning electron microscope
author_sort Wong, W.K.
title Charging identification and compensation in the scanning electron microscope
title_short Charging identification and compensation in the scanning electron microscope
title_full Charging identification and compensation in the scanning electron microscope
title_fullStr Charging identification and compensation in the scanning electron microscope
title_full_unstemmed Charging identification and compensation in the scanning electron microscope
title_sort charging identification and compensation in the scanning electron microscope
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/72520
_version_ 1821206409498329088