Diagnosability of faults using finite-state automaton model

Diagnosability of faults using finite-state automaton model

IEEE Region 10 Annual International Conference, Proceedings/TENCON

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Bibliographic Details
Main Authors: Xi, YunXia, Lim, Khiang-Wee, Ho, Weng-Khuen, Preisig, Heinz A.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72577
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Institution: National University of Singapore
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Summary:IEEE Region 10 Annual International Conference, Proceedings/TENCON

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