Diagnosability of faults using finite-state automaton model
IEEE Region 10 Annual International Conference, Proceedings/TENCON
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2014
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sg-nus-scholar.10635-725772015-01-16T12:50:13Z Diagnosability of faults using finite-state automaton model Xi, YunXia Lim, Khiang-Wee Ho, Weng-Khuen Preisig, Heinz A. ELECTRICAL ENGINEERING IEEE Region 10 Annual International Conference, Proceedings/TENCON 2 II-367 85QXA 2014-06-19T05:09:36Z 2014-06-19T05:09:36Z 2000 Conference Paper Xi, YunXia,Lim, Khiang-Wee,Ho, Weng-Khuen,Preisig, Heinz A. (2000). Diagnosability of faults using finite-state automaton model. IEEE Region 10 Annual International Conference, Proceedings/TENCON 2 : II-367. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72577 NOT_IN_WOS Scopus |
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IEEE Region 10 Annual International Conference, Proceedings/TENCON |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Xi, YunXia Lim, Khiang-Wee Ho, Weng-Khuen Preisig, Heinz A. |
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Conference or Workshop Item |
author |
Xi, YunXia Lim, Khiang-Wee Ho, Weng-Khuen Preisig, Heinz A. |
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Xi, YunXia Lim, Khiang-Wee Ho, Weng-Khuen Preisig, Heinz A. Diagnosability of faults using finite-state automaton model |
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Xi, YunXia |
title |
Diagnosability of faults using finite-state automaton model |
title_short |
Diagnosability of faults using finite-state automaton model |
title_full |
Diagnosability of faults using finite-state automaton model |
title_fullStr |
Diagnosability of faults using finite-state automaton model |
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Diagnosability of faults using finite-state automaton model |
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diagnosability of faults using finite-state automaton model |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/72577 |
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