Effect of some geometric and packaging process parameters on die metallization failure
Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
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sg-nus-scholar.10635-725962015-03-27T17:47:04Z Effect of some geometric and packaging process parameters on die metallization failure Tay, A.A.O. Ong, S.H. Lim, Y.K. ELECTRICAL ENGINEERING MECHANICAL & PRODUCTION ENGINEERING Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA 21-26 00234 2014-06-19T05:09:50Z 2014-06-19T05:09:50Z 1995 Conference Paper Tay, A.A.O.,Ong, S.H.,Lim, Y.K. (1995). Effect of some geometric and packaging process parameters on die metallization failure. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 21-26. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72596 NOT_IN_WOS Scopus |
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Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Tay, A.A.O. Ong, S.H. Lim, Y.K. |
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Tay, A.A.O. Ong, S.H. Lim, Y.K. |
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Tay, A.A.O. Ong, S.H. Lim, Y.K. Effect of some geometric and packaging process parameters on die metallization failure |
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Tay, A.A.O. |
title |
Effect of some geometric and packaging process parameters on die metallization failure |
title_short |
Effect of some geometric and packaging process parameters on die metallization failure |
title_full |
Effect of some geometric and packaging process parameters on die metallization failure |
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Effect of some geometric and packaging process parameters on die metallization failure |
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Effect of some geometric and packaging process parameters on die metallization failure |
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effect of some geometric and packaging process parameters on die metallization failure |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/72596 |
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