Fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tables
IECON Proceedings (Industrial Electronics Conference)
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Main Authors: | Ramkumar, K.B., Druckenmueller, M., Xi, Y.X., Philips, P., Presig, H.A., Ho, W.K., Lim, K.W. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72636 |
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Institution: | National University of Singapore |
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