Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs
Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-726772015-02-03T21:57:29Z Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA 86-90 00234 2014-06-19T05:10:46Z 2014-06-19T05:10:46Z 1995 Conference Paper Lou, C.L.,Chim, W.K.,Chan, D.S.H.,Pan, Y. (1995). Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 86-90. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72677 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. |
| format |
Conference or Workshop Item |
| author |
Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. |
| spellingShingle |
Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs |
| author_sort |
Lou, C.L. |
| title |
Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs |
| title_short |
Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs |
| title_full |
Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs |
| title_fullStr |
Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs |
| title_full_unstemmed |
Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs |
| title_sort |
hot-carrier induced degradation in the subthreshold characteristics of ldd pmosfets |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72677 |
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1681087609205424128 |