Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
10.1016/S1369-8001(02)00020-3
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2014
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sg-nus-scholar.10635-726992023-10-30T21:27:02Z Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates Feng, Z.C. Yang, T.R. Hou, Y.T. ELECTRICAL ENGINEERING GaN Infrared reflectance Non-destructive Sapphire Silicon 10.1016/S1369-8001(02)00020-3 Materials Science in Semiconductor Processing 4 6 571-576 2014-06-19T05:11:00Z 2014-06-19T05:11:00Z 2001-12 Conference Paper Feng, Z.C., Yang, T.R., Hou, Y.T. (2001-12). Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates. Materials Science in Semiconductor Processing 4 (6) : 571-576. ScholarBank@NUS Repository. https://doi.org/10.1016/S1369-8001(02)00020-3 13698001 http://scholarbank.nus.edu.sg/handle/10635/72699 000175066200020 Scopus |
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National University of Singapore |
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NUS Library |
| continent |
Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| topic |
GaN Infrared reflectance Non-destructive Sapphire Silicon |
| spellingShingle |
GaN Infrared reflectance Non-destructive Sapphire Silicon Feng, Z.C. Yang, T.R. Hou, Y.T. Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates |
| description |
10.1016/S1369-8001(02)00020-3 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Feng, Z.C. Yang, T.R. Hou, Y.T. |
| format |
Conference or Workshop Item |
| author |
Feng, Z.C. Yang, T.R. Hou, Y.T. |
| author_sort |
Feng, Z.C. |
| title |
Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates |
| title_short |
Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates |
| title_full |
Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates |
| title_fullStr |
Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates |
| title_full_unstemmed |
Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates |
| title_sort |
infrared reflectance analysis of gan epitaxial layers grown on sapphire and silicon substrates |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72699 |
| _version_ |
1781783264334184448 |