An efficient scanning pattern for layered manufacturing processes

An efficient scanning pattern for layered manufacturing processes

Proceedings - IEEE International Conference on Robotics and Automation

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Bibliographic Details
Main Authors: Yang, Y., Fuh, J.Y.H., Loh, H.T., Wang, Y.G.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Depth tree
Equidistant path
Rapid prototyping
Scanning pattern
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73162
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Institution: National University of Singapore
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Summary:Proceedings - IEEE International Conference on Robotics and Automation

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