An efficient scanning pattern for layered manufacturing processes

• Main Authors: Yang, Y., Fuh, J.Y.H., Loh, H.T., Wang, Y.G.
• Other Authors: MECHANICAL ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Depth tree; Equidistant path; Rapid prototyping; Scanning pattern
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/73162
• Institution: National University of Singapore

Proceedings - IEEE International Conference on Robotics and Automation