Defect measurement using structured light system

Proceedings of SPIE - The International Society for Optical Engineering

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Bibliographic Details
Main Authors:	Toh, Siew-Lok, Low, W.K., Tay, C.J., Shang, H.M., Asundi, Anand K.
Other Authors:	MECHANICAL & PRODUCTION ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/74977
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-74977
record_format	dspace
spelling	sg-nus-scholar.10635-749772015-01-16T12:50:09Z Defect measurement using structured light system Toh, Siew-Lok Low, W.K. Tay, C.J. Shang, H.M. Asundi, Anand K. MECHANICAL & PRODUCTION ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering 2921 529-534 PSISD 2014-06-19T09:09:32Z 2014-06-19T09:09:32Z 1997 Conference Paper Toh, Siew-Lok,Low, W.K.,Tay, C.J.,Shang, H.M.,Asundi, Anand K. (1997). Defect measurement using structured light system. Proceedings of SPIE - The International Society for Optical Engineering 2921 : 529-534. ScholarBank@NUS Repository. 0819423238 0277786X http://scholarbank.nus.edu.sg/handle/10635/74977 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of SPIE - The International Society for Optical Engineering
author2	MECHANICAL & PRODUCTION ENGINEERING
author_facet	MECHANICAL & PRODUCTION ENGINEERING Toh, Siew-Lok Low, W.K. Tay, C.J. Shang, H.M. Asundi, Anand K.
format	Conference or Workshop Item
author	Toh, Siew-Lok Low, W.K. Tay, C.J. Shang, H.M. Asundi, Anand K.
spellingShingle	Toh, Siew-Lok Low, W.K. Tay, C.J. Shang, H.M. Asundi, Anand K. Defect measurement using structured light system
author_sort	Toh, Siew-Lok
title	Defect measurement using structured light system
title_short	Defect measurement using structured light system
title_full	Defect measurement using structured light system
title_fullStr	Defect measurement using structured light system
title_full_unstemmed	Defect measurement using structured light system
title_sort	defect measurement using structured light system
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/74977
_version_	1681088020928790528

Defect measurement using structured light system

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