Defect measurement using structured light system

• Main Authors: Toh, Siew-Lok, Low, W.K., Tay, C.J., Shang, H.M., Asundi, Anand K.
• Other Authors: MECHANICAL & PRODUCTION ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/74977
• Institution: National University of Singapore

Proceedings of SPIE - The International Society for Optical Engineering