Ex and in situ confocal raman studies of organic thin film and its on-working transistors
10.1021/jp807466e
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sg-nus-scholar.10635-761432023-10-26T21:05:02Z Ex and in situ confocal raman studies of organic thin film and its on-working transistors Bao, Q. Gan, Y. Li, J. Li, C.M. CHEMISTRY 10.1021/jp807466e Journal of Physical Chemistry C 112 49 19718-19726 2014-06-23T05:39:07Z 2014-06-23T05:39:07Z 2008-12-11 Article Bao, Q., Gan, Y., Li, J., Li, C.M. (2008-12-11). Ex and in situ confocal raman studies of organic thin film and its on-working transistors. Journal of Physical Chemistry C 112 (49) : 19718-19726. ScholarBank@NUS Repository. https://doi.org/10.1021/jp807466e 19327447 http://scholarbank.nus.edu.sg/handle/10635/76143 000261426600079 Scopus |
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CHEMISTRY |
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CHEMISTRY Bao, Q. Gan, Y. Li, J. Li, C.M. |
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Bao, Q. Gan, Y. Li, J. Li, C.M. |
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Bao, Q. Gan, Y. Li, J. Li, C.M. Ex and in situ confocal raman studies of organic thin film and its on-working transistors |
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Bao, Q. |
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Ex and in situ confocal raman studies of organic thin film and its on-working transistors |
title_short |
Ex and in situ confocal raman studies of organic thin film and its on-working transistors |
title_full |
Ex and in situ confocal raman studies of organic thin film and its on-working transistors |
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Ex and in situ confocal raman studies of organic thin film and its on-working transistors |
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Ex and in situ confocal raman studies of organic thin film and its on-working transistors |
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ex and in situ confocal raman studies of organic thin film and its on-working transistors |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/76143 |
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