Determination of secondary electron yield from insulators due to a low-kV electron beam

Determination of secondary electron yield from insulators due to a low-kV electron beam

Journal of Applied Physics

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Bibliographic Details
Main Authors: Yong, Y.C., Thong, J.T.L., Phang, J.C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80357
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Institution: National University of Singapore
Description
Summary:Journal of Applied Physics

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