Determination of secondary electron yield from insulators due to a low-kV electron beam

Journal of Applied Physics

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Main Authors:	Yong, Y.C., Thong, J.T.L., Phang, J.C.H.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80357
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-80357
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spelling	sg-nus-scholar.10635-803572015-02-20T04:16:47Z Determination of secondary electron yield from insulators due to a low-kV electron beam Yong, Y.C. Thong, J.T.L. Phang, J.C.H. ELECTRICAL ENGINEERING Journal of Applied Physics 84 8 4543-4548 JAPIA 2014-10-07T02:56:39Z 2014-10-07T02:56:39Z 1998-10-15 Article Yong, Y.C.,Thong, J.T.L.,Phang, J.C.H. (1998-10-15). Determination of secondary electron yield from insulators due to a low-kV electron beam. Journal of Applied Physics 84 (8) : 4543-4548. ScholarBank@NUS Repository. 00218979 http://scholarbank.nus.edu.sg/handle/10635/80357 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Journal of Applied Physics
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Yong, Y.C. Thong, J.T.L. Phang, J.C.H.
format	Article
author	Yong, Y.C. Thong, J.T.L. Phang, J.C.H.
spellingShingle	Yong, Y.C. Thong, J.T.L. Phang, J.C.H. Determination of secondary electron yield from insulators due to a low-kV electron beam
author_sort	Yong, Y.C.
title	Determination of secondary electron yield from insulators due to a low-kV electron beam
title_short	Determination of secondary electron yield from insulators due to a low-kV electron beam
title_full	Determination of secondary electron yield from insulators due to a low-kV electron beam
title_fullStr	Determination of secondary electron yield from insulators due to a low-kV electron beam
title_full_unstemmed	Determination of secondary electron yield from insulators due to a low-kV electron beam
title_sort	determination of secondary electron yield from insulators due to a low-kv electron beam
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80357
_version_	1681088872582217728

Determination of secondary electron yield from insulators due to a low-kV electron beam

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