Front- and backside investigations of thermal and electronic properties of semiconducting devices
Microelectronics Reliability
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2014
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sg-nus-scholar.10635-804632015-01-08T00:47:56Z Front- and backside investigations of thermal and electronic properties of semiconducting devices Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. ELECTRICAL ENGINEERING Microelectronics Reliability 39 6-7 937-940 MCRLA 2014-10-07T02:57:49Z 2014-10-07T02:57:49Z 1999-06 Article Fiege, G.B.M.,Schade, W.,Palaniappan, M.,Ng, V.,Phang, J.C.H.,Balk, L.J. (1999-06). Front- and backside investigations of thermal and electronic properties of semiconducting devices. Microelectronics Reliability 39 (6-7) : 937-940. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/80463 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Microelectronics Reliability |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. |
| format |
Article |
| author |
Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. |
| spellingShingle |
Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| author_sort |
Fiege, G.B.M. |
| title |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_short |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_full |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_fullStr |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_full_unstemmed |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_sort |
front- and backside investigations of thermal and electronic properties of semiconducting devices |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80463 |
| _version_ |
1681088892327952384 |