Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
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sg-nus-scholar.10635-805552015-01-15T02:35:37Z Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors Lau, W.S. ELECTRICAL ENGINEERING Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 29 5 690-693 JAPLD 2014-10-07T02:58:49Z 2014-10-07T02:58:49Z 1990-05 Article Lau, W.S. (1990-05). Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 29 (5) : 690-693. ScholarBank@NUS Repository. 00214922 http://scholarbank.nus.edu.sg/handle/10635/80555 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Lau, W.S. |
| format |
Article |
| author |
Lau, W.S. |
| spellingShingle |
Lau, W.S. Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors |
| author_sort |
Lau, W.S. |
| title |
Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors |
| title_short |
Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors |
| title_full |
Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors |
| title_fullStr |
Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors |
| title_full_unstemmed |
Identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors |
| title_sort |
identification and suppression of defects responsible for electrical hysteresis in metal-nitride-silicon capacitors |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80555 |
| _version_ |
1681088909435469824 |