Infrared reflectance investigation of undoped and Si-doped GaN films on sapphire

Infrared reflectance investigation of undoped and Si-doped GaN films on sapphire

Physica Status Solidi (B) Basic Research

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Bibliographic Details
Main Authors: Feng, Z.C., Hou, Y.T., Li, M.F., Chua, S.J., Wang, W., Zhu, L.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80601
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/80601

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