Investigation of capacitive coupling voltage contrast using a specimen charging model

Microelectronic Engineering

Saved in:
Bibliographic Details
Main Authors: Sim, K., Chan, D., Phang, J.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80630
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore