Microcracks of the alumina of the thin-film head: study and simulation

Microcracks of the alumina of the thin-film head: study and simulation

10.1109/20.490247

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Bibliographic Details
Main Authors: Chekanov, A.S., Low, T.S., Alli, S., Liu, B., Teo, B.S., Hu, S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80718
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/80718

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