Microcracks of the alumina of the thin-film head: study and simulation
10.1109/20.490247
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sg-nus-scholar.10635-807182023-10-30T07:24:44Z Microcracks of the alumina of the thin-film head: study and simulation Chekanov, A.S. Low, T.S. Alli, S. Liu, B. Teo, B.S. Hu, S. ELECTRICAL ENGINEERING DATA STORAGE INSTITUTE 10.1109/20.490247 IEEE Transactions on Magnetics 31 6 pt 1 2991-2993 IEMGA 2014-10-07T03:00:34Z 2014-10-07T03:00:34Z 1995-11 Article Chekanov, A.S., Low, T.S., Alli, S., Liu, B., Teo, B.S., Hu, S. (1995-11). Microcracks of the alumina of the thin-film head: study and simulation. IEEE Transactions on Magnetics 31 (6 pt 1) : 2991-2993. ScholarBank@NUS Repository. https://doi.org/10.1109/20.490247 00189464 http://scholarbank.nus.edu.sg/handle/10635/80718 A1995TD55600128 Scopus |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Chekanov, A.S. Low, T.S. Alli, S. Liu, B. Teo, B.S. Hu, S. |
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Chekanov, A.S. Low, T.S. Alli, S. Liu, B. Teo, B.S. Hu, S. |
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Chekanov, A.S. Low, T.S. Alli, S. Liu, B. Teo, B.S. Hu, S. Microcracks of the alumina of the thin-film head: study and simulation |
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Chekanov, A.S. |
title |
Microcracks of the alumina of the thin-film head: study and simulation |
title_short |
Microcracks of the alumina of the thin-film head: study and simulation |
title_full |
Microcracks of the alumina of the thin-film head: study and simulation |
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Microcracks of the alumina of the thin-film head: study and simulation |
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Microcracks of the alumina of the thin-film head: study and simulation |
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microcracks of the alumina of the thin-film head: study and simulation |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/80718 |
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