The effects of current spreading in the semiconductor on the determination of contact resistance

Solid State Electronics

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Bibliographic Details
Main Authors: Chua, S.J., Chong, T.C., Lee, S.H., Wang, Y.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81249
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Institution: National University of Singapore

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