The effects of current spreading in the semiconductor on the determination of contact resistance
Solid State Electronics
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Main Authors: | Chua, S.J., Chong, T.C., Lee, S.H., Wang, Y.S. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81249 |
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Institution: | National University of Singapore |
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