Three-dimensional analysis of locally deposited silicon oxide on ferrite by a combination of microprobe RBS and PIXE

Three-dimensional analysis of locally deposited silicon oxide on ferrite by a combination of microprobe RBS and PIXE

Nuclear Inst. and Methods in Physics Research, B

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Bibliographic Details
Main Authors: Kinomura, A., Horino, Y., Mokuno, Y., Chayahara, A., Kiuchi, M., Fujii, K., Takai, M., Lu, Y.-F.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81284
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/81284

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