Three-dimensional analysis of locally deposited silicon oxide on ferrite by a combination of microprobe RBS and PIXE

• Main Authors: Kinomura, A., Horino, Y., Mokuno, Y., Chayahara, A., Kiuchi, M., Fujii, K., Takai, M., Lu, Y.-F.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/81284
• Institution: National University of Singapore

Nuclear Inst. and Methods in Physics Research, B