Transit time effect in electron beam testing voltage measurements

10.1088/0957-0233/3/9/006

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Bibliographic Details
Main Author:	Thong, J.T.L.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81302
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Institution:	National University of Singapore

Description
Summary:	10.1088/0957-0233/3/9/006

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