Transit time effect in electron beam testing voltage measurements
10.1088/0957-0233/3/9/006
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Main Author: | Thong, J.T.L. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81302 |
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Institution: | National University of Singapore |
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