Yield optimization by design centering & worst-case distance analysis

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

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Bibliographic Details
Main Authors: Samudra, G.S., Chen, H.M., Chan, D.S.H., Ibrahim, Yaacob
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81368
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Institution: National University of Singapore